ThetaMetrisis's core technology is White Light Reflectance Spectroscopy (WLRS) that allows accurate and simultaneous measurement of thickness and refractive index of stacked thin and thick films in ultra-wide range from few Angstroms to millimeters.

Applications

• Semiconductors

• Photovoltaics

• Photonics

• Process Control

• Material Characterization

• Optical Coatings

• Polymers

• Chem- & Bio-Sensing

• Packaging

• Education

Products

▶ FR-pRo   

    Build-To-Order tool for any coating characterization needs

▶ FR-pOrtable    

    Accurate Characterization of Coatings at the Point-of-Need

▶ FR-μProbe

▶ FR-Scanner

    Automated, Ultrafast, mapping of Thickness & Refr Index

▶ FR-Education    

▶ BioAnalyzer    

    Fast & Label-free monitoring of bioreactions